Hitachi TM3000 Benchtop Scanning Electron Microscope

The Hitachi TM3000 Benchtop Scanning Electron Microscope (SEM)  is easy to use compared to traditional SEMs and allows for observation of uncoated specimens in low vacuum mode.

It can handle relatively large specimens and the high performance vacuum system provides a fast pump-down (about 2 min) and venting (about 1 min). Our laboratory is also equipped with a critical point drier and sputter coater for specimen preparation. 

Specifications

  • Magnification: 15-30 000X
  • Observation conditions: 5 /15kV
  • Max sample size: 70mm diam., 50mm height
  • Semiconductor BSE Detector
  • High and low vacuum mode

See our photo gallery of the SEM for more images

NIWA scanning electron microscopy (SEM) services

Interested in using our SEM facilities? We offer a quick, flexible service that includes consultation, training, supervision and all consumables to ensure you obtain the best quality images possible. Because our benchtop SEM is easy to use, only a short training session is required, after which users can opt to prepare and produce images themselves and at a fraction of the cost normally charged.

It is also possible to send us your samples for processing by our SEM technician.

Cost (all inclusive):

First three hours: $180/hour (required)

Hourly rate for use of instrument after initial three hours- $70/hour or $80/hour (including sputter coater)

For more information contact Daniel Leduc
daniel.leduc@niwa.co.nz

NIWA scientist Daniel Leduc with NIWA's new Hitachi TM-3000 Tabletop Microscope. [Dave Allen]
Uncoated bryozoan - 250x magnification. [Daniel Leduc]